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Characterization of CMOS Image Sensors with Nyquist Rate Pixel Level ADC
ixel level ADC dark current fixed pattern noise read noise QE
2015/8/17
Techniques for characterizing CCD imagers have been developed over many years. These techniques have been recently modified and extended to CMOS PPS and APS imagers. With the scaling of CMOS technolog...
A Nyquist Rate Pixel Level ADC for CMOS Image Sensors
Nyquist Rate Pixel Level ADC CMOS Image Sensors
2015/8/17
A Nyquist rate Multi-Channel Bit Serial (MCBS) ADC using successive comparisons is presented. The ADC is suited to pixel level implementation in a CMOS image sensor. It comprises a 1-bit comparator/la...